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Scanning Thermal Microscopy Basics – Part 3 of 3

This video presentation covers the basics of scanning thermal microscopy, a scanning probe-based measurement technique for mapping thermal properties of samples. SThM enables the measurement of temperature, thermal conductivity, heat capacity, and other thermodynamic measurements with nanoscale resolution. Duration : 0:7:41

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Scanning Thermal Microscopy Basics – Part 2 of 3

This video presentation covers the basics of scanning thermal microscopy, a scanning probe-based measurement technique for mapping thermal properties of samples. SThM enables the measurement of temperature, thermal conductivity, heat capacity, and other thermodynamic measurements with nanoscale resolution. Duration : 0:8:44

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Scanning Thermal Microscopy Basics – Part 1 of 3

This video presentation covers the basics of scanning thermal microscopy, a scanning probe-based measurement technique for mapping thermal properties of samples. SThM enables the measurement of temperature, thermal conductivity, heat capacity, and other thermodynamic measurements with nanoscale resolution. Duration : 0:10:30

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Wii Teach You AFM

Atomic Force Microscopy (AFM) is an important tool for nanotechnology. We tried to use more interesting and interactive way to demonstrate how AFM works. We build a hand held optical lever model (called AFM education kit) that allows people use this model to scan a nanostructure model. A powerful device, WiiTM-mote controller (NintendoTM) is used […]