Duration : 0:2:40

The MSA-500 Micro System Analyzer is a powerful new all-in-one measurement workstation for precise 3-D dynamic characterization of MEMS and MOEMS microstructures.
* Characterize out-of-plane vibrations by Scanning Laser-Doppler Vibrometry
* Measure in-plane motion and vibration by Stroboscopic Video Microscopy
* Determine surface topography by White Light Interferometry
* Test wafers and individual die by combining Polytecs MSA-500 with a MEMS probe station

Duration : 0:7:32

The MSA-400 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures.
Using standard microscope optics, Polytec’s microscope-based systems for measurement of out-of-plane and in-plane vibrations can easily be integrated into existing systems.
For wafer-level testing, all systems can easily be mounted onto manual or fully automated probe stations.

Duration : 0:3:3