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	<title>MEMSuniverse &#187; 2</title>
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		<title>Polytec, Inc Measuring 3-D Dynamics and Topography of Microstructure &#8211; The System</title>
		<link>http://www.memsuniverse.com/mems/polytec-inc-measuring-3-d-dynamics-and-topography-of-microstructure-the-system.html</link>
		<comments>http://www.memsuniverse.com/mems/polytec-inc-measuring-3-d-dynamics-and-topography-of-microstructure-the-system.html#comments</comments>
		<pubDate>Thu, 05 Mar 2009 06:17:56 +0000</pubDate>
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				<category><![CDATA[MEMS]]></category>
		<category><![CDATA[2]]></category>
		<category><![CDATA[Microstructures]]></category>
		<category><![CDATA[Part]]></category>

		<guid isPermaLink="false">http://www.memsuniverse.com/?p=1164</guid>
		<description><![CDATA[The MSA-500 Micro System Analyzer is a powerful new all-in-one measurement workstation for precise 3-D dynamic characterization of MEMS and MOEMS microstructures. * Characterize out-of-plane vibrations by Scanning Laser-Doppler Vibrometry * Measure in-plane motion and vibration by Stroboscopic Video Microscopy * Determine surface topography by White Light Interferometry * Test wafers and individual die by [...]]]></description>
			<content:encoded><![CDATA[<p><img src="http://i.ytimg.com/vi/59B6mBKLSWA/2.jpg" alt="" align="left" /><span>The MSA-500 Micro System Analyzer is a powerful new all-in-one measurement workstation for precise 3-D dynamic characterization of MEMS and MOEMS microstructures. * Characterize out-of-plane vibrations by Scanning Laser-Doppler Vibrometry * Measure in-plane motion and vibration by Stroboscopic Video Microscopy * Determine surface topography by White Light Interferometry * Test wafers and individual die by combining Polytecs MSA-500 with a MEMS probe station </span></p>
<p>Duration : <strong>0:2:40</strong></p>
<p><span id="more-1164"></span><br />
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