admin | Aug 14, 2008 | Comments 2
Mighty EBIC ( Electron Beam Induced Current) in use on a Scanning Electron Microscope ephemeron-labs.com
Duration : 0:1:16
Filed Under: Optical-MEMS & MOEMS
Tags: "Scanning • beam • current • EBIC • electron • Induced • microscope • Nanotechnology • SEM
About the Author:
Leave a Reply | Trackback URL
This is a project of Ephemeron Labs the device under test is a Hetero Junction Quantum Well Metal Semiconductor Metal detector. The images shown are the response to the high energy electrons hitting at each point, showing depeltion regions and areas with internal electric fields. The system is still in prototype phase, but a commercial version should come out with in 6 months and cost around 10k.
wonderful product, can be used as educational instrument?
Mail (will not be published) (required)
× nine = 54
Notify me of followup comments via e-mail
RSS Feed | Comments Feed
Get the latest updates via email.
Privacy guaranteed. We will not share your information.
This feature has not been activated yet.