Workshop on Metrology and Standards for Nanoelectronics

Event Details:

Start date : May 17, 2010
End date : May 17, 2010
Location : Grenoble
Organized by : NIST and LETI

Event Description:

This is your opportunity to foster communication and cooperation and to identify pressing measurement and associated standards infrastructure needs and gaps in the area of nanoelectronics for more than Moore (MtM) applications. MtM applications include the domains of 1) RF and Analog/Mixed-Signal technologies, 2) Energy (e.g., solar, photovoltaics, smart grid, and storage-batteries), 3) Imaging (e.g., quantitative medical imaging), 4) Sensor/Actuators (e.g, biosensors), 5) Bio-Chips (e.g., bioelectronics), and 6) 3D Heterogeneous Integration.

Map for The event