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SPIE Scanning Microscopy 2010

Event Details:

Start date : May 17, 2010
End date : May 19, 2010
Location : Monterey, CA
Organized by : SPIE

Event Description:

Submit your research to SPIE Scanning Microscopy 2010, a multidisciplinary forum
that seeks to advance scanning microscopy technologies and applications.

Papers will be accepted in these areas:

• Forensics
• Helium Ion Microscopy
• Atomic Force and Scanned Probe Microscopies
• Microscopy and Analysis of Biological Materials
• Sample Preparation Technology
• Microscopy and Analysis of Food Microstructures
• Microscopy Applications in Environmental Safety and Health
• Focused Ion Beam Microscopy
• Microspectroscopic Characterization with Multiple Probes
• Optical Characterization of Biological Materials
• Scanning Electron Microscopies
• Applications of Scanning Microscopy to Forensics Science
• Electron Beam Interaction Modeling Workshop
• Discussion of NIST DTSA-II for Spectral Modeling

Participate at SPIE Scanning Microscopy 2010

The conference for scientists and researchers to share ideas and find technical
solutions, funding sources, and personal connections that help ensure their
success.

Map for The event



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