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Microscopy of Semiconducting Materials 2011 (MSM XVII)

Event Details:

Start date : April 04, 2011
End date : April 07, 2011
Location : Churchill College, Cambridge
Organized by : IOP Electron Microscopy and Analysis Group (EMAG)

Event Description:

The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the applications of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

Map for The event



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