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RSSArchive for April, 2010

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SPIE Lithography Asia 2010

It is our great pleasure to invite you to participate in the third SPIE Lithography Asia conference, featuring presentations from leading researchers, developers, and innovators, and building on last year’s very successful conference. This is your opportunity to present your research and connect with others working at the leading edge of semiconductor device and flat […]

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Seeing at the Nanoscale VIII

We have the pleasure to announce Seeing at the Nanoscale VIII, the eighth annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques. The event will be held from August 30th to September 1st, 2010, at the Congress Center in Basel, Switzerland, as part of the 550th […]

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First International Nanotechnology Congress

Nanotechnology, and implicitly, Nanoscience are contiuously developing and require a highly cooperative work of scientists with various backgrounds. This has not spread enough in our society and changing this situation is the main goal of the First International Congress on Nanotechnology Ruben Orellana. This conference will gather world leading scientists specialized in diverse fields of […]